Experience
Research- 5.5 years (IIT Guwahati)
Industry- 2 years (Ericsson India Private Limited)
Teachings
Embedded System,,
Testing and Verification of VLSI Circuits
Education
PhD- IIT Guwahati (Pursuing)
M.Tech- IIEST Shibpur
B.Tech- WBUT
Contact Address :
Dept. of ECE,
NIT Sikkim, Barfung Block, Ravangla, postcode - 737139
Journals:
1. Indrajit Das and Nagarjuna Nallam, "Noise Cancelation? Explained!: The Role of Feedback in Noise-Canceling LNAs and Receivers," in IEEE Microwave Magazine, vol. 18, no. 6, pp. 100-109, Sept.-Oct. 2017.
Conferences:
1. Indrajit Das and Nagarjuna Nallam, "Systematic Generation of Flicker and Thermal Noise Canceling Circuits", IEEE International Symposium on Circuits and Systems (ISCAS), Sapporo, May 2019.
2. Indrajit Das, Manodipan Sahoo, Pranab Roy, Hafizur Rahaman,"A 45 uW 13 pJ/conv-step 7.4-ENOB 40 kS/s SAR ADC for digital microfluidic biochip applications", VDAT 2014: pp.1-6.
indrajit@nitsikkim.ac.in 
+91 8585826910 